S.I.S. SURFACE IMAGING SYSTEMS
S.I.S. develops, manufactures and distributes advanced atomic force/scanning probe microscopy systems (AFM/SPM) for numerous applications in materials research, including semiconductors, data storage, electronic materials, solar cells, polymers and catalysts. AFM/SPM is a well-established method for ultra-high spatial resolution surface imaging and the characterization of surfaces down to atomic dimensions.
S.I.S. SURFACE IMAGING SYSTEMS
Industry:
Developer Platform Manufacturing Semiconductor
Founded:
1993-01-01
Address:
Herzogenrath, Nordrhein-Westfalen, Germany
Country:
Germany
Status:
Active
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