S.I.S. SURFACE IMAGING SYSTEMS

S.I.S. develops, manufactures and distributes advanced atomic force/scanning probe microscopy systems (AFM/SPM) for numerous applications in materials research, including semiconductors, data storage, electronic materials, solar cells, polymers and catalysts. AFM/SPM is a well-established method for ultra-high spatial resolution surface imaging and the characterization of surfaces down to atomic dimensions.

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S.I.S. SURFACE IMAGING SYSTEMS

Industry:
Developer Platform Manufacturing Semiconductor

Founded:
1993-01-01

Address:
Herzogenrath, Nordrhein-Westfalen, Germany

Country:
Germany

Status:
Active


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Bruker acquires S.I.S. Surface Imaging Systems - 2008-09-01 ...

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