ACTIVE LAYER PARAMETRICS

Active Layer Parametrics (ALP Inc.) has developed a system to rapidly and accurately measure mobility and activated carrier concentration profiles with Angstrom-level resolution for the semiconductor manufacturing industry. These profiles detail the depth of electrical activation due to implant-anneal recipes. We're the only system in the world that is capable of doing these measurements on a routine basis. The goal of the company is: Improve Yield by Quick Feedback: Instead having to wait for weeks to get devices made, we could do that in a matter of minutes. Improve Device performance: By tracking process changes to electronic impact - we currently do this 'matrix-analysis'.